SPECTRUM:
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Spectrum - European Edition 11 (June 2010)

Table of Contents:
Cryogenic technology – Cryostation – the sophisticated optical cryostat
Cryogenic technology – Now introducing: individually configurable cryostats by HPD
Ellipsometry – Combining M-2000 Spectroscopic Ellipsometry with Q-Sense QCM-D Measurements
Imaging – Spectral unmixing – a new analysing method for immunohistochemistry
Imaging – New: high-resolution hyperspectral imaging sensor
Imaging – CMOS OEM camera modules for flexible camera design
Interferometry – The NewView 7100 – A new universal measuring tool made of 40 years of experience
Interferometry – Zygo DynaPhase – accurate metrology under extreme vibration conditions
Laser – MicroWriter™ – the new laser lithography system
Light Sources – Tunable monochromatic light sources
Light Sources – Light Sources & Photonic Tools 2010 – get your personal copy now!
Magnetometry – MFM Vortex – imaging with the Quantum Design PPMS®
Nanotechnology - Dip Pen Nanolithography – multiplexed protein arrays
Nanotechnology – JPK Electrochemistry Cell (ECCell™) module for NanoWizard® AFM
Nanotechnology – Polyethylene Glycol (PEG) ink for cross-platform application
Nanotechnology – JPK Conductive AFM (CAFM) module for NanoWizard® AFM
Nanotechnology – New ways to detect carbon nanotubes (CNT)
Particles – CPS presents the latest model in their high-quality, particle size analyser series
Spectroscopy – New dimensions in nanoscale IR imaging & spectroscopy
Spectroscopy – Oculus: Plug & play USB single element detectors
Spectroscopy – NEW to Andor’s family of spectroscopy solutions: The Shamrock 500 & 750
Spectroscopy – New product line: Spectroradiometers from 320 nm to 2500 nm


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 News:
Register for our Free Anasys Nanoscale IR Spectroscopy Webinar, Sept 15th 3-4pm BST
Das Spectrum 119 (September 2010) ist online!
Cryostat for effective optical and electrical measurements from 3 K to 350 K
Spectrum European Edition 11 (June 10) is online!
Anasys Instruments: Nanoscale IR spectroscopy and thermal analysis
UV-VIS-NIR spectroradiometers designed for radiometric measurements and characterisation of artificial light sources and solar simulators
SPM insert for the QD PPMS®

LOT-Oriel GmbH & Co. KG
E-mail: info@lot-oriel.de

Im Tiefen See 58
D-64293 Darmstadt

Phone: +49 6151 - 88 06 0
Fax: +49 6151 - 896667


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