PRODUCTS:
 Optical Filters, Lenses, A...
 Light Sources, Monochromat...
 Analytics and Spectroscopy...
 Lasers, Laseroptics, Laser...
 Imaging, IR-/HighSpeed, Me...
 New Materials Properties, ...
 Surface Metrology, Thin Fi...
 Nanotechnology, SPM, AFM
 Photovoltaic

Imaging, Hyperspectral Imaging, IR-/HighSpeed/C-MOS, Metrology
Infrared and Near Infrared Camera Systems High Speed Cameras
IR Lenses Nuance – Multi Spectral Imaging System
C-MOS Cameras Maestro in-vivo Imaging System
Pulse Thermography, Nondestructive Testing Abrio™/LC-PolScope™
Optical Profiler, Stress Analysis Hyperspectral Imaging
CCD, ICCD and EMCCD Detectors for High-End Imaging CT-Systeme für den µm- und nm-Bereich
Phenom Imaging System  



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 Links:
Quantum Design:
→ www.qd-international.com

 News:
→ Register for our Free Anasys Nanoscale IR Spectroscopy Webinar, Sept 15th 3-4pm BST
→ Das Spectrum 119 (September 2010) ist online!
→ Cryostat for effective optical and electrical measurements from 3 K to 350 K
→ Spectrum European Edition 11 (June 10) is online!
→ Anasys Instruments: Nanoscale IR spectroscopy and thermal analysis
→ UV-VIS-NIR spectroradiometers designed for radiometric measurements and characterisation of artificial light sources and solar simulators
→ SPM insert for the QD PPMS®

LOT-Oriel GmbH & Co. KG
E-mail: info@lot-oriel.de

Im Tiefen See 58
D-64293 Darmstadt

Phone: +49 6151 - 88 06 0
Fax: +49 6151 - 896667


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